Semiconductor Test Probe CPM-011

Semiconductor Test Probe CPM-011

Model Number:
CPM-011
Dimension:
0.00 X 0.00 X 0.00 cm
Available:
2
Price:
$na
 
 
Ship To (shipping cost):
Taiwan ($na)
Payments:
Payments
Guarantee:
Get the item you ordered or get your money back.

Seller Details

Rating:

positive ratings
Location:
Taiwan
Joined:
27 November 2023
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Product Description

CPM provides a series of semiconductor test probe products. Our products offer high-performance compliance, extremely low and stable DC resistance. The products are developed specifically for semiconductor testing and can be applied with various sockets for examinations. The testing factories can ensure the comprehensive inspections of the connections among electrical parts on ICs before the shipment by changing the types of contact probes based on the features of testing objectives. Materials and finishes: 1. Plunger-Top: Pd Alloy 2. Plunger-Bottom: Pd Alloy 3. Barrel: P.B. / Au Plated 4. Spring: Music Wire / Au Plated Mechanical: 1. Spring Force: 4grams @0.35mm 2. Full Travel: 0.5mm 3. Recommend Travel: 0.35mm 4. Mechanical Life: 50K Electrical: 1. Current Rating: 0.3A 2. Contact Resistance: <200m?

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